Aikaterini Papadopoulou

EECS Department, University of California, Berkeley

Technical Report No. UCB/EECS-2012-11

January 13, 2012

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.pdf

Advisors: Borivoje Nikolic

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BibTeX citation:

@mastersthesis{Papadopoulou:EECS-2012-11,
    Author= {Papadopoulou, Aikaterini},
    Title= {Characterization of Variability in Deeply-Scaled Fully Depleted SOI Devices},
    School= {EECS Department, University of California, Berkeley},
    Year= {2012},
    Month= {Jan},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.html},
    Number= {UCB/EECS-2012-11},
}

EndNote citation:

%0 Thesis
%A Papadopoulou, Aikaterini 
%T Characterization of Variability in Deeply-Scaled Fully Depleted SOI Devices
%I EECS Department, University of California, Berkeley
%D 2012
%8 January 13
%@ UCB/EECS-2012-11
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.html
%F Papadopoulou:EECS-2012-11