John Wright
EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2017-220
December 15, 2017
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.pdf
Advisor: Borivoje Nikolic
BibTeX citation:
@mastersthesis{Wright:EECS-2017-220, Author = {Wright, John}, Title = {Design of a Lightweight Serial Link Generator for Test Chips}, School = {EECS Department, University of California, Berkeley}, Year = {2017}, Month = {Dec}, URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.html}, Number = {UCB/EECS-2017-220} }
EndNote citation:
%0 Thesis %A Wright, John %T Design of a Lightweight Serial Link Generator for Test Chips %I EECS Department, University of California, Berkeley %D 2017 %8 December 15 %@ UCB/EECS-2017-220 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.html %F Wright:EECS-2017-220