John Wright

EECS Department, University of California, Berkeley

Technical Report No. UCB/EECS-2017-220

December 15, 2017

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.pdf

Advisors: Borivoje Nikolic

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BibTeX citation:

@mastersthesis{Wright:EECS-2017-220,
    Author= {Wright, John},
    Title= {Design of a Lightweight Serial Link Generator for Test Chips},
    School= {EECS Department, University of California, Berkeley},
    Year= {2017},
    Month= {Dec},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.html},
    Number= {UCB/EECS-2017-220},
}

EndNote citation:

%0 Thesis
%A Wright, John 
%T Design of a Lightweight Serial Link Generator for Test Chips
%I EECS Department, University of California, Berkeley
%D 2017
%8 December 15
%@ UCB/EECS-2017-220
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.html
%F Wright:EECS-2017-220