John Wright

EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2017-220
December 15, 2017

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.pdf

Advisor: Borivoje Nikolic

BibTeX citation:

@mastersthesis{Wright:EECS-2017-220,
    Author = {Wright, John},
    Title = {Design of a Lightweight Serial Link Generator for Test Chips},
    School = {EECS Department, University of California, Berkeley},
    Year = {2017},
    Month = {Dec},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.html},
    Number = {UCB/EECS-2017-220}
}

EndNote citation:

%0 Thesis
%A Wright, John
%T Design of a Lightweight Serial Link Generator for Test Chips
%I EECS Department, University of California, Berkeley
%D 2017
%8 December 15
%@ UCB/EECS-2017-220
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-220.html
%F Wright:EECS-2017-220