Modeling and Design of Nanoscale Ferroelectric and Negative-Capacitance Gate Transistors (EECS-2022-32)
Yu-Hung Liao

Towards High-Endurance, Nonvolatile, CMOS-Compatible Ferroelectric Memories for Next-Generation Computing (EECS-2022-17)
Ava Tan

Design and Characterization of Ferroelectric Negative Capacitance (EECS-2018-131)
Korok Chatterjee

BSIM 4.1.0 MOSFET Model-User's Manual (M00/48)
W. Liu, X. Jin, K.M. Cao and Chenming Hu

BSIM 4.0.0 Technical Notes (M00/39)
W. Liu, K.M. Cao, X. Jin and Chenming Hu

BSIM 4.0.0 MOSFET Model User's Manual (M00/38)
W. Liu, X. Jin, K.M. Cao and Chenming Hu

BSIM01 v2.0 MOSFET Model - User's Manual for BSIMFD2.0 (M99/44)
Chenming Hu, J-N. Feng, W-D. Liu, S.K.H. Fung, P. Su and S. Tang

BSIMS01 v2.0 MOSFET Model - User's Manual for BSIM002.0 (M99/43)
Chenming Hu, J-N. Feng, W-D. Liu, S.K.H. Fung, P. Su and S. Tang

BSIM3v3.2.1 MOSFET Model Users' Manual (M99/19)
W. Liu, X. Jin, J. Chen, M-C. Jeng, Z. Liu, Y. Cheng, K. Chen, M. Chan, K. Hui, J. Huang, R. Tu, P.K. Ko and Chenming Hu

BSIM3v3.2.2 MOSFET Model Users' Manual (M99/18)
W. Liu, X. Jin, J. Chen, M-C. Jeng, Z. Liu, Y. Cheng, K. Chen, M. Chan, K. Hui, J. Huang, R. Tu, P.K. Ko and Chenming Hu

BSIM 3v3.2 MOSFET Model Users' Manual (M98/51)
W. Liu, X. Jin, J. Chen, M-C. Jeng, Z. Liu, Y. Cheng, K. Chen, M. Chan, K. Hui, J. Huang, R. Tu, P.K. Ko and Chenming Hu

An Accurate MOSFET Intrinsic Capacitance Model Considering Quantum Mechanic Effect for BSIM 3v3.2 (M98/47)
W. Liu, X. Jin, Y-C. King and Chenming Hu

BSIM 3v3 Manual (Final Version) (M97/2)
Y. Cheng, M. Chan, K. Hui, M. Jeng, Z. Liu, J. Huang, K. Chen, J. Chen, R. Tu, P.K. Ko and Chenming Hu

A Robust Physical and Predictive Model for Deep-Submicrometer MOS Circuit Simulation (M93/57)
J.H. Huang, Z.H. Liu, M.C. Jeng, P.K. Ko and Chenming Hu

A Physical Model for MOSFET Output Resistance (M93/56)
J.H. Huang, Z.H. Liu, M.C. Jeng, P.K. Ko and Chenming Hu

BERT - Berkeley Reliability Tools (M91/107)
R.H. Tu, E. Rosenbaum, C.C. Li, W.Y. Chan, P.M. Lee, B-K. Liew, J.D. Burnett, P.K. Ko and Chenming Hu

BERT - Circuit Oxide Reliability Simulator (CORS) (M90/4)
E. Rosenbaum, P.M. Lee, R. Moazzami, P.K. Ko and Chenming Hu

BERT - Circuit Electromigration Simulator (M90/3)
B.K. Liew, P. Fang, Nathan W. Cheung and Chenming Hu

BERT - Circuit Aging Simulator (CAS) (M90/2)
P.M. Lee, M.M. Kuo, P.K. Ko and Chenming Hu

SPICE3 Implementation of a Non-Quasi-Static MOSFET Model with Level-2 DC Model (M89/70)
H.J. Park, P.K. Ko and Chenming Hu

Implementation of the BSIM Substrate Current and Degradation Models in SCALP (M87/39)
M.M. Kuo, K. Seki, P.M. Lee, P.K. Ko and Chenming Hu

Theory, Algorithms, and User's Guide for BSIM and SCALP (M87/35)
M-C. Jeng, P.M. Lee, M.M. Kuo, P.K. Ko and Chenming Hu

BSIM - Substrate Current Modeling Appendix C: Implementation of the BSIM Substrate Current and Degradation Models in SCALP (M87/8)
P.M. Lee, M.M. Kuo, M. Maghsoodnia, P.K. Ko and Chenming Hu

BSIM - Substrate Current Modeling Appendix C: SPICE Implementation of the BSIM Substrate Current and Degradation Models (M86/64)
P.M. Lee, P.K. Ko and Chenming Hu

Compact Short-Channel IGFET Model (CSIM) and A Compact IGFET Charge Model (M84/20)
B.J. Sheu, D. Scharfetter, H.C. Poon, B.J. Sheu, D.L. Scharfetter, Chenming Hu and D.O. Pederson